Publication

System Health & Risk Management

International Journal


	Title	Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review
	Journal	IEEE Transactions on Power Electronics
	Authors	Hyunseok Oh, Bongtae Han^*, Patrick McCluskey, Changwoon Han, and Byeng D. Youn
	Classification	Not selected
	Date	2015-05
	Citation Index	SCIE (IF: 6.7, Rank: 15.1%)
	Vol. / Page	Vol. 30, No. 5
	File	(Physics-of-Failure, Condition Monitoring and Prognostics of Insulated Gate Bipolar Transistor Modules.pdf)
	Link	doi.org/10.1109/TPEL.2014.2346485
	Visits	282

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