Publication

System Health & Risk Management

International Conference


	Title	Stochastic Model for Assembly Quality Prediction Using 3D Random Field Characterization Technique
	Conference	7th China-Japan-Korea Joint Symposium on Optimization of Structural and Mechanical Systems
	Authors	Dae Whan Kim, Joung Taek Youn, and Byeng D. Youn
	Classification	Not selected
	Date	2012-06-18
	Presentation Type	Oral
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	Visits	99

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