Publication

System Health & Risk Management

International Journal


	Title	Forward-Stepwise Regression Analysis for Fine Leak Batch Testing of Wafer-level Hermetic MEMS Packages
	Journal	Microelectronics Reliability
	Authors	Changsoo Jang, Byeng D. Youn, Ping F. Wang, Bongtae Han^*, and Suk-Jin Ham
	Classification	Not selected
	Date	2010-4
	Citation Index	SCIE (IF: 1.6, Rank: 77.3%)
	Vol. / Page	Vol. 50
	File	(Forward-Stepwise Regression Analysis for Fine Leak Batch Testing of Wafer-level Hermetic MEMS Packages.pdf)
	Link	doi.org/10.1016/j.microrel.2009.11.014
	Visits	197

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