Publication

System Health & Risk Management

International Conference


	Title	Failure Precursor Identification and Degradation Modeling for Insulated Gate Bipolar Transistors Subjected to Electrical Stress
	Conference	Annual Conference of the Prognostics and Health Management Society 2016
	Authors	Junmin Lee, Hyunseok Oh, Chan Hee Park, Byeng D. Youn, Deog Hyeon Kim, Byung Hwa Kim, and Yong Un Cho
	Classification	Prognostics & Health Management
	Date	2016-10-03
	Presentation Type	Oral
	Vol. / Page	177
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	Link
	Visits	189

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