Publication

System Health & Risk Management

Domestic Conference


	Title	Degradation Model of Insulated Gate Bipolar Transistor for Fault Prognostics of Motor Drive System
	Conference	PHM KOREA 2019
	Authors	이준민, 윤병동
	Classification	Prognostics & Health Management
	Date	2019-04-11
	Presentation Type	포스터
	Vol. / Page
	File
	Link
	Visits	74

이전글	변압기 절연 열화 시험의 불균형 데이터셋을 활용한 …
다음글	Fault Diagnosis of PMSM with Inter-turn Short Cir…